redonkable/alistair23-linux
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[E1000E]: convert register test macros to functions

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Add functions for reg_pattern_test and reg_set_and check
Changed macros to use these functions

Compiled x86, untested

Size decreased ~2K

old:

$ size drivers/net/e1000e/ethtool.o
   text    data     bss     dec     hex filename
  14461       0       0   14461    387d drivers/net/e1000e/ethtool.o

new:

$ size drivers/net/e1000e/ethtool.o
   text    data     bss     dec     hex filename
  12498       0       0   12498    30d2 drivers/net/e1000e/ethtool.o

Signed-off-by: Joe Perches <joe@perches.com>
Signed-off-by: Auke Kok <auke-jan.h.kok@intel.com>
Signed-off-by: David S. Miller <davem@davemloft.net>
This commit is contained in:
Joe Perches 2007-11-13 20:53:51 -08:00 committed by David S. Miller
parent 7e64300a0f
commit 2a88719197
1 changed files with 53 additions and 31 deletions
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84
drivers/net/e1000e/ethtool.c
View file

@ -690,41 +690,63 @@ err_setup:
return err; return err;
} }
#define REG_PATTERN_TEST(R, M, W) REG_PATTERN_TEST_ARRAY(R, 0, M, W) bool reg_pattern_test_array(struct e1000_adapter *adapter, u64 *data,
#define REG_PATTERN_TEST_ARRAY(reg, offset, mask, writeable) \ int reg, int offset, u32 mask, u32 write)
{ \ {
u32 _pat; \ int i;
u32 _value; \ u32 read;
u32 _test[] = {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; \ static const u32 test[] =
for (_pat = 0; _pat < ARRAY_SIZE(_test); _pat++) { \ {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};
E1000_WRITE_REG_ARRAY(hw, reg, offset, \ for (i = 0; i < ARRAY_SIZE(test); i++) {
(_test[_pat] & writeable)); \ E1000_WRITE_REG_ARRAY(&adapter->hw, reg, offset,
_value = E1000_READ_REG_ARRAY(hw, reg, offset); \ (test[i] & write));
if (_value != (_test[_pat] & writeable & mask)) { \ read = E1000_READ_REG_ARRAY(&adapter->hw, reg, offset);
ndev_err(netdev, "pattern test reg %04X " \ if (read != (test[i] & write & mask)) {
"failed: got 0x%08X expected 0x%08X\n", \ ndev_err(adapter->netdev, "pattern test reg %04X "
reg + offset, \ "failed: got 0x%08X expected 0x%08X\n",
value, (_test[_pat] & writeable & mask)); \ reg + offset,
*data = reg; \ read, (test[i] & write & mask));
return 1; \ *data = reg;
} \ return true;
} \ }
}
return false;
} }
#define REG_SET_AND_CHECK(R, M, W) \ static bool reg_set_and_check(struct e1000_adapter *adapter, u64 *data,
{ \ int reg, u32 mask, u32 write)
u32 _value; \ {
__ew32(hw, R, W & M); \ u32 read;
_value = __er32(hw, R); \ __ew32(&adapter->hw, reg, write & mask);
if ((W & M) != (_value & M)) { \ read = __er32(&adapter->hw, reg);
ndev_err(netdev, "set/check reg %04X test failed: " \ if ((write & mask) != (read & mask)) {
"got 0x%08X expected 0x%08X\n", R, (_value & M), \ ndev_err(adapter->netdev, "set/check reg %04X test failed: "
(W & M)); \ "got 0x%08X expected 0x%08X\n", reg, (read & mask),
*data = R; \ (write & mask));
return 1; \ *data = reg;
} \ return true;
}
return false;
} }
#define REG_PATTERN_TEST(R, M, W) \
do { \
if (reg_pattern_test_array(adapter, data, R, 0, M, W)) \
return 1; \
} while (0)
#define REG_PATTERN_TEST_ARRAY(R, offset, M, W) \
do { \
if (reg_pattern_test_array(adapter, data, R, offset, M, W)) \
return 1; \
} while (0)
#define REG_SET_AND_CHECK(R, M, W) \
do { \
if (reg_set_and_check(adapter, data, R, M, W)) \
return 1; \
} while (0)
static int e1000_reg_test(struct e1000_adapter *adapter, u64 *data) static int e1000_reg_test(struct e1000_adapter *adapter, u64 *data)
{ {
struct e1000_hw *hw = &adapter->hw; struct e1000_hw *hw = &adapter->hw;