[MTD] OneNAND: Add missing files
Simple bad block table source and header files Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com> Signed-off-by: Thomas Gleixner <tglx@linutronix.de>hifive-unleashed-5.1
Kyungmin Park
Thomas Gleixner
parent
0255fc1b08
commit
87590e26ff
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/*
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* linux/drivers/mtd/onenand/onenand_bbt.c
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*
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* Bad Block Table support for the OneNAND driver
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*
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* Copyright(c) 2005 Samsung Electronics
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* Kyungmin Park <kyungmin.park@samsung.com>
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*
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* Derived from nand_bbt.c
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*
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* TODO:
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* Split BBT core and chip specific BBT.
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*/
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#include <linux/slab.h>
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#include <linux/mtd/mtd.h>
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#include <linux/mtd/onenand.h>
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#include <linux/mtd/compatmac.h>
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/**
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* check_short_pattern - [GENERIC] check if a pattern is in the buffer
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* @param buf the buffer to search
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* @param len the length of buffer to search
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* @param paglen the pagelength
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* @param td search pattern descriptor
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*
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* Check for a pattern at the given place. Used to search bad block
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* tables and good / bad block identifiers. Same as check_pattern, but
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* no optional empty check and the pattern is expected to start
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* at offset 0.
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*
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*/
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static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td)
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{
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int i;
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uint8_t *p = buf;
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/* Compare the pattern */
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for (i = 0; i < td->len; i++) {
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if (p[i] != td->pattern[i])
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return -1;
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}
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return 0;
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}
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/**
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* create_bbt - [GENERIC] Create a bad block table by scanning the device
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* @param mtd MTD device structure
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* @param buf temporary buffer
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* @param bd descriptor for the good/bad block search pattern
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* @param chip create the table for a specific chip, -1 read all chips.
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* Applies only if NAND_BBT_PERCHIP option is set
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*
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* Create a bad block table by scanning the device
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* for the given good/bad block identify pattern
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*/
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static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip)
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{
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struct onenand_chip *this = mtd->priv;
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struct bbm_info *bbm = this->bbm;
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int i, j, numblocks, len, scanlen;
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int startblock;
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loff_t from;
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size_t readlen, ooblen;
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printk(KERN_INFO "Scanning device for bad blocks\n");
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len = 1;
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/* We need only read few bytes from the OOB area */
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scanlen = ooblen = 0;
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readlen = bd->len;
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/* chip == -1 case only */
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/* Note that numblocks is 2 * (real numblocks) here;
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* see i += 2 below as it makses shifting and masking less painful
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*/
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numblocks = mtd->size >> (bbm->bbt_erase_shift - 1);
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startblock = 0;
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from = 0;
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for (i = startblock; i < numblocks; ) {
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int ret;
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for (j = 0; j < len; j++) {
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size_t retlen;
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/* No need to read pages fully,
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* just read required OOB bytes */
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ret = mtd->read_oob(mtd, from + j * mtd->oobblock + bd->offs,
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readlen, &retlen, &buf[0]);
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if (ret)
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return ret;
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if (check_short_pattern(&buf[j * scanlen], scanlen, mtd->oobblock, bd)) {
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bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
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printk(KERN_WARNING "Bad eraseblock %d at 0x%08x\n",
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i >> 1, (unsigned int) from);
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break;
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}
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}
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i += 2;
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from += (1 << bbm->bbt_erase_shift);
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}
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return 0;
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}
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/**
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* onenand_memory_bbt - [GENERIC] create a memory based bad block table
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* @param mtd MTD device structure
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* @param bd descriptor for the good/bad block search pattern
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*
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* The function creates a memory based bbt by scanning the device
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* for manufacturer / software marked good / bad blocks
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*/
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static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd)
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{
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unsigned char data_buf[MAX_ONENAND_PAGESIZE];
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bd->options &= ~NAND_BBT_SCANEMPTY;
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return create_bbt(mtd, data_buf, bd, -1);
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}
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/**
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* onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad
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* @param mtd MTD device structure
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* @param offs offset in the device
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* @param allowbbt allow access to bad block table region
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*/
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static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
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{
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struct onenand_chip *this = mtd->priv;
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struct bbm_info *bbm = this->bbm;
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int block;
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uint8_t res;
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/* Get block number * 2 */
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block = (int) (offs >> (bbm->bbt_erase_shift - 1));
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res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
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DEBUG(MTD_DEBUG_LEVEL2, "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
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(unsigned int) offs, block >> 1, res);
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switch ((int) res) {
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case 0x00: return 0;
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case 0x01: return 1;
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case 0x02: return allowbbt ? 0 : 1;
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}
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return 1;
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}
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/**
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* onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s)
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* @param mtd MTD device structure
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* @param bd descriptor for the good/bad block search pattern
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*
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* The function checks, if a bad block table(s) is/are already
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* available. If not it scans the device for manufacturer
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* marked good / bad blocks and writes the bad block table(s) to
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* the selected place.
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*
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* The bad block table memory is allocated here. It must be freed
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* by calling the onenand_free_bbt function.
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*
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*/
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int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
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{
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struct onenand_chip *this = mtd->priv;
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struct bbm_info *bbm = this->bbm;
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int len, ret = 0;
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len = mtd->size >> (this->erase_shift + 2);
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/* Allocate memory (2bit per block) */
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bbm->bbt = kmalloc(len, GFP_KERNEL);
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if (!bbm->bbt) {
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printk(KERN_ERR "onenand_scan_bbt: Out of memory\n");
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return -ENOMEM;
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}
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/* Clear the memory bad block table */
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memset(bbm->bbt, 0x00, len);
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/* Set the bad block position */
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bbm->badblockpos = ONENAND_BADBLOCK_POS;
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/* Set erase shift */
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bbm->bbt_erase_shift = this->erase_shift;
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if (!bbm->isbad_bbt)
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bbm->isbad_bbt = onenand_isbad_bbt;
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/* Scan the device to build a memory based bad block table */
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if ((ret = onenand_memory_bbt(mtd, bd))) {
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printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
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kfree(bbm->bbt);
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bbm->bbt = NULL;
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}
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return ret;
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}
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/*
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* Define some generic bad / good block scan pattern which are used
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* while scanning a device for factory marked good / bad blocks.
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*/
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static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
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static struct nand_bbt_descr largepage_memorybased = {
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.options = 0,
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.offs = 0,
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.len = 2,
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.pattern = scan_ff_pattern,
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};
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/**
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* onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device
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* @param mtd MTD device structure
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*
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* This function selects the default bad block table
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* support for the device and calls the onenand_scan_bbt function
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*/
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int onenand_default_bbt(struct mtd_info *mtd)
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{
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struct onenand_chip *this = mtd->priv;
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struct bbm_info *bbm;
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this->bbm = kmalloc(sizeof(struct bbm_info), GFP_KERNEL);
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if (!this->bbm)
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return -ENOMEM;
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bbm = this->bbm;
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memset(bbm, 0, sizeof(struct bbm_info));
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/* 1KB page has same configuration as 2KB page */
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if (!bbm->badblock_pattern)
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bbm->badblock_pattern = &largepage_memorybased;
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return onenand_scan_bbt(mtd, bbm->badblock_pattern);
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}
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EXPORT_SYMBOL(onenand_scan_bbt);
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EXPORT_SYMBOL(onenand_default_bbt);
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@ -0,0 +1,122 @@
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/*
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* linux/include/linux/mtd/bbm.h
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*
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* NAND family Bad Block Management (BBM) header file
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* - Bad Block Table (BBT) implementation
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*
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* Copyright (c) 2005 Samsung Electronics
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* Kyungmin Park <kyungmin.park@samsung.com>
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*
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* Copyright (c) 2000-2005
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* Thomas Gleixner <tglx@linuxtronix.de>
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*
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*/
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#ifndef __LINUX_MTD_BBM_H
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#define __LINUX_MTD_BBM_H
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/* The maximum number of NAND chips in an array */
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#define NAND_MAX_CHIPS 8
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/**
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* struct nand_bbt_descr - bad block table descriptor
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* @param options options for this descriptor
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* @param pages the page(s) where we find the bbt, used with
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* option BBT_ABSPAGE when bbt is searched,
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* then we store the found bbts pages here.
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* Its an array and supports up to 8 chips now
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* @param offs offset of the pattern in the oob area of the page
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* @param veroffs offset of the bbt version counter in the oob are of the page
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* @param version version read from the bbt page during scan
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* @param len length of the pattern, if 0 no pattern check is performed
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* @param maxblocks maximum number of blocks to search for a bbt. This number of
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* blocks is reserved at the end of the device
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* where the tables are written.
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* @param reserved_block_code if non-0, this pattern denotes a reserved
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* (rather than bad) block in the stored bbt
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* @param pattern pattern to identify bad block table or factory marked
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* good / bad blocks, can be NULL, if len = 0
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*
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* Descriptor for the bad block table marker and the descriptor for the
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* pattern which identifies good and bad blocks. The assumption is made
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* that the pattern and the version count are always located in the oob area
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* of the first block.
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*/
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struct nand_bbt_descr {
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int options;
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int pages[NAND_MAX_CHIPS];
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int offs;
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int veroffs;
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uint8_t version[NAND_MAX_CHIPS];
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int len;
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int maxblocks;
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int reserved_block_code;
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uint8_t *pattern;
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};
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/* Options for the bad block table descriptors */
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/* The number of bits used per block in the bbt on the device */
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#define NAND_BBT_NRBITS_MSK 0x0000000F
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#define NAND_BBT_1BIT 0x00000001
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#define NAND_BBT_2BIT 0x00000002
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#define NAND_BBT_4BIT 0x00000004
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#define NAND_BBT_8BIT 0x00000008
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/* The bad block table is in the last good block of the device */
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#define NAND_BBT_LASTBLOCK 0x00000010
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/* The bbt is at the given page, else we must scan for the bbt */
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#define NAND_BBT_ABSPAGE 0x00000020
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/* The bbt is at the given page, else we must scan for the bbt */
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#define NAND_BBT_SEARCH 0x00000040
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/* bbt is stored per chip on multichip devices */
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#define NAND_BBT_PERCHIP 0x00000080
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/* bbt has a version counter at offset veroffs */
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#define NAND_BBT_VERSION 0x00000100
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/* Create a bbt if none axists */
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#define NAND_BBT_CREATE 0x00000200
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/* Search good / bad pattern through all pages of a block */
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#define NAND_BBT_SCANALLPAGES 0x00000400
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/* Scan block empty during good / bad block scan */
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#define NAND_BBT_SCANEMPTY 0x00000800
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/* Write bbt if neccecary */
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#define NAND_BBT_WRITE 0x00001000
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/* Read and write back block contents when writing bbt */
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#define NAND_BBT_SAVECONTENT 0x00002000
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/* Search good / bad pattern on the first and the second page */
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#define NAND_BBT_SCAN2NDPAGE 0x00004000
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/* The maximum number of blocks to scan for a bbt */
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#define NAND_BBT_SCAN_MAXBLOCKS 4
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/*
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* Constants for oob configuration
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*/
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#define ONENAND_BADBLOCK_POS 0
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/**
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* struct bbt_info - [GENERIC] Bad Block Table data structure
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* @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
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* @param badblockpos [INTERN] position of the bad block marker in the oob area
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* @param bbt [INTERN] bad block table pointer
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* @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
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* @param priv [OPTIONAL] pointer to private bbm date
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*/
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struct bbm_info {
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int bbt_erase_shift;
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int badblockpos;
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int options;
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uint8_t *bbt;
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int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
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/* TODO Add more NAND specific fileds */
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struct nand_bbt_descr *badblock_pattern;
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void *priv;
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};
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/* OneNAND BBT interface */
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extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
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extern int onenand_default_bbt(struct mtd_info *mtd);
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#endif /* __LINUX_MTD_BBM_H */
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