From bfe033a048f7ce486e01f3ef5a7a24618088af44 Mon Sep 17 00:00:00 2001 From: "Adamski, Krzysztof (Nokia - PL/Wroclaw)" Date: Sun, 14 Apr 2019 21:58:40 +0000 Subject: [PATCH] hwmon: Document the samples attributes Document new ABI attributes: {in,power,curr,temp}_samples and samples. Signed-off-by: Krzysztof Adamski Signed-off-by: Guenter Roeck --- Documentation/hwmon/sysfs-interface | 18 ++++++++++++++++++ 1 file changed, 18 insertions(+) diff --git a/Documentation/hwmon/sysfs-interface b/Documentation/hwmon/sysfs-interface index 2b9e1005d88b..7b91706d01c8 100644 --- a/Documentation/hwmon/sysfs-interface +++ b/Documentation/hwmon/sysfs-interface @@ -756,6 +756,24 @@ intrusion[0-*]_beep 1: enable RW +******************************** +* Average sample configuration * +******************************** + +Devices allowing for reading {in,power,curr,temp}_average values may export +attributes for controlling number of samples used to compute average. + +samples Sets number of average samples for all types of measurements. + RW + +in_samples +power_samples +curr_samples +temp_samples Sets number of average samples for specific type of measurements. + Note that on some devices it won't be possible to set all of them + to different values so changing one might also change some others. + RW + sysfs attribute writes interpretation -------------------------------------