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this program is free software you can redistribute it and or modify
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GPL-2.0-only
has been chosen to replace the boilerplate/reference in 64 file(s).
Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
Reviewed-by: Alexios Zavras <alexios.zavras@intel.com>
Reviewed-by: Allison Randal <allison@lohutok.net>
Cc: linux-spdx@vger.kernel.org
Link: https://lkml.kernel.org/r/20190529141901.894819585@linutronix.de
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
Add nfit_test 'watermarks' for the dax_pmem, dax_pmem_core, and
dax_pmem_compat modules. This causes the nfit_test module to fail
loading in case any of these modules are also not overridden with the
ldconfig wrapped modules. Without this, nfit_test would sometimes fail
creation of device-dax namespaces on the nfit_test_bus with an unhelpful
error log such as:
dax_pmem dax5.0: could not reserve metadata
dax_pmem: probe of dax5.0 failed with error -16
Which was caused due to the unwrapped version of
devm_request_mem_region() being called.
Cc: Dan Williams <dan.j.williams@intel.com>
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Overwrite retains the security state after completion of operation. Fix
nfit_test to reflect this so that the kernel can test the behavior it is
more likely to see in practice.
Fixes: 926f74802c ("tools/testing/nvdimm: Add overwrite support for nfit_test")
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Add a zero key in order to standardize hardware that want a key of 0's to
be passed. Some platforms defaults to a zero-key with security enabled
rather than allow the OS to enable the security. The zero key would allow
us to manage those platform as well. This also adds a fix to secure erase
so it can use the zero key to do crypto erase. Some other security commands
already use zero keys. This introduces a standard zero-key to allow
unification of semantics cross nvdimm security commands.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
* Use common helpers, bitmap_zalloc() and kstrndup(), to replace open
coded versions.
* Clarify the comments around hotplug vs initial init case for the nfit
driver.
* Cleanup the libnvdimm init path.
Adding test support for new Intel DSM from v1.8. The ability of simulating
master passphrase update and master secure erase have been added to
nfit_test.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
With the implementation of Intel NVDIMM DSM overwrite, we are adding unit
test to nfit_test for testing of overwrite operation.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Add nfit_test support for DSM functions "Get Security State",
"Set Passphrase", "Disable Passphrase", "Unlock Unit", "Freeze Lock",
and "Secure Erase" for the fake DIMMs.
Also adding a sysfs knob in order to put the DIMMs in "locked" state. The
order of testing DIMM unlocking would be.
1a. Disable DIMM X.
1b. Set Passphrase to DIMM X.
2. Write to
/sys/devices/platform/nfit_test.0/nfit_test_dimm/test_dimmX/lock_dimm
3. Renable DIMM X
4. Check DIMM X state via sysfs "security" attribute for nmemX.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
In preparation for libnvdimm growing new restrictions to detect section
conflicts between persistent memory regions, enable nfit_test to
allocate aligned resources. Use a gen_pool to allocate nfit_test's fake
resources in a separate address space from the virtual translation of
the same.
Reviewed-by: Vishal Verma <vishal.l.verma@intel.com>
Tested-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
KASAN reports following global out of bounds access while
nfit_test is being loaded. The out of bound access happens
the following reference to dimm_fail_cmd_flags[dimm]. 'dimm' is
over than the index value, NUM_DCR (==5).
static int override_return_code(int dimm, unsigned int func, int rc)
{
if ((1 << func) & dimm_fail_cmd_flags[dimm]) {
dimm_fail_cmd_flags[] definition:
static unsigned long dimm_fail_cmd_flags[NUM_DCR];
'dimm' is the return value of get_dimm(), and get_dimm() returns
the index of handle[] array. The handle[] has 7 index. Let's use
ARRAY_SIZE(handle) as the array size.
KASAN report:
==================================================================
BUG: KASAN: global-out-of-bounds in nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
Read of size 8 at addr ffffffffc10cbbe8 by task kworker/u41:0/8
...
Call Trace:
dump_stack+0xea/0x1b0
? dump_stack_print_info.cold.0+0x1b/0x1b
? kmsg_dump_rewind_nolock+0xd9/0xd9
print_address_description+0x65/0x22e
? nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
kasan_report.cold.6+0x92/0x1a6
nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
...
The buggy address belongs to the variable:
dimm_fail_cmd_flags+0x28/0xffffffffffffa440 [nfit_test]
==================================================================
Fixes: 39611e83a2 ("tools/testing/nvdimm: Make DSM failure code injection...")
Signed-off-by: Masayoshi Mizuma <m.mizuma@jp.fujitsu.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.
Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Some NVDIMMs, in addition to providing an indication of whether the
previous shutdown was clean, also provide a running count of lifetime
dirty-shutdown events for the device. In anticipation of this
functionality appearing on more devices arrange for the nfit driver to
retrieve / cache this data at DIMM discovery time, and export it via
sysfs.
Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
The emulation for smart injection commands for nfit neglected to check
the smart field validity flags before injecting to that field. This is
required as a way to distinguish un-injection vs. leave-alone.
The emulation was also missing support for un-injection entirely. To add
this support, first, fix the above flags check. Second, use the
'enable' field in the injection command to determine injection vs
un-injection. Third, move the smart initialization struct to be a global
static structure for the nfit_test module. Reference this to get the
smart 'defaults' when un-injecting a smart field.
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
In addition to populating the value the payload also needs to set the
"controller temperature valid" flag.
Fixes: cdd77d3e19 ("nfit, libnvdimm: deprecate the generic SMART ioctl")
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
In order to emulate the behavior of the NVDIMM_FAMILY_INTEL DSMs
nfit_test needs the ability to execute the DSM and then override the
return code.
Split the current return code injection from get_dimm() and apply at
after the function has executed to override the return status.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Commit 546eb0317c "libnvdimm, pmem: Do not flush power-fail protected CPU caches"
fixed the write_cache detection to correctly show the lack of a write
cache based on the platform capabilities described in the ACPI NFIT. The
nfit_test unit tests expected a write cache to be present, so change the
nfit test namespaces to only advertise a persistence domain limited to
the memory controller. This allows the kernel to show a write_cache
attribute, and the test behaviour remains unchanged.
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Reviewed-by: Ross Zwisler <ross.zwisler@linux.intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Given the fact that the ACPI "EINJ" (error injection) facility is not
universally available, implement software infrastructure to validate the
memcpy_mcsafe() exception handling implementation.
For each potential read exception point in memcpy_mcsafe(), inject a
emulated exception point at the address identified by 'mcsafe_inject'
variable. With this infrastructure implement a test to validate that the
'bytes remaining' calculation is correct for a range of various source
buffer alignments.
This code is compiled out by default. The CONFIG_MCSAFE_DEBUG
configuration symbol needs to be manually enabled by editing
Kconfig.debug. I.e. this functionality can not be accidentally enabled
by a user / distro, it's only for development.
Cc: <x86@kernel.org>
Cc: Ingo Molnar <mingo@redhat.com>
Cc: Borislav Petkov <bp@alien8.de>
Cc: Tony Luck <tony.luck@intel.com>
Cc: Al Viro <viro@zeniv.linux.org.uk>
Cc: Thomas Gleixner <tglx@linutronix.de>
Cc: Andy Lutomirski <luto@amacapital.net>
Cc: Peter Zijlstra <peterz@infradead.org>
Cc: Andrew Morton <akpm@linux-foundation.org>
Cc: Linus Torvalds <torvalds@linux-foundation.org>
Reported-by: Tony Luck <tony.luck@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Sysfs userspace tooling generally expects the kernel to emit a newlines
when reading sysfs attributes.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
The nfit_test.1 bus provides a pmem topology without blk-aperture
enabling, so it presents different failure modes for label space
handling. Allow custom DSM command error injection.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Given that libnvdimm driver stack takes specific actions on DIMM command
error codes like -EACCES, provide a facility to inject custom failures.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
The default value for smart ctrl_temperature was the same as the
threshold for ctrl_temperature. As a result, any arbitrary smart
injection to the nfit_test dimm could cause this alarm to trigger
and cause an acpi notification. Drop the default value to below the
threshold, so that unrelated injections don't trigger notifications.
Cc: Dan Williams <dan.j.williams@intel.com>
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Add support for the smart injection command in the nvdimm unit test
framework. This allows for directly injecting to smart fields and flags
that are supported in the injection command. If the injected values are
past the threshold, then an acpi notification is also triggered.
Cc: Dan Williams <dan.j.williams@intel.com>
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
When you load nfit_test you currently see the following error in dmesg:
nfit_test nfit_test.0: found a zero length table '0' parsing nfit
This happens because when we parse the nfit_test.0 table via
acpi_nfit_init(), we specify a size of nfit_test->nfit_size. For the first
pass through nfit_test.0 where (t->setup_hotplug == 0) this is the size of
the entire buffer we allocated, including space for the hot plug
structures, not the size that we've actually filled in.
Fix this by only trying to parse the size of the structures that we've
filled in.
Signed-off-by: Ross Zwisler <ross.zwisler@linux.intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
It turns out that we were overrunning the 'nfit_buf' buffer in
nfit_test0_setup() in the (t->setup_hotplug == 1) case because we failed to
correctly account for all of the acpi_nfit_memory_map structures.
Fix the structure count which will increase the allocation size of
'nfit_buf' in nfit_test0_alloc(). Also add some WARN_ON()s to
nfit_test0_setup() and nfit_test1_setup() to catch future issues where the
size of the buffer doesn't match the amount of data we're writing.
Signed-off-by: Ross Zwisler <ross.zwisler@linux.intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
In nfit_test0_setup() and nfit_test1_setup() we keep an 'offset' value
which we use to calculate where in our 'nfit_buf' we will place our next
structure. The handling of 'offset' and the calculation of the placement
of the next structure is a bit inconsistent, though. We don't update
'offset' after we insert each structure, sometimes causing us to update it
for multiple structures' sizes at once. When calculating the position of
the next structure we aren't always able to just use 'offset', but
sometimes have to add in other structure sizes as well.
Fix this by updating 'offset' after each structure insertion in a
consistent way, allowing us to always calculate the position of the next
structure to be inserted by just using 'nfit_buf + offset'.
Signed-off-by: Ross Zwisler <ross.zwisler@linux.intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
The libnvdimm unit tests will fail when they are run against the
production / in-tree version of libnvdimm.ko or nfit.ko due to
symbols not being mocked per nfit_test's expectation. For example,
nfit_test expects acpi_evaluate_dsm() to be replaced by
__wrap_acpi_evaluate_dsm() to test how acpi_nfit_ctl() responds to
different stimuli.
Create a test-only symbol name that nfit_test links against to cause
module load failures when the wrong module is present.
For example, with this change, attempts to use the wrong module will
report:
nfit_test: Unknown symbol libnvdimm_test (err 0)
Reported-by: Dave Jiang <dave.jiang@intel.com>
Reported-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Adding support code to simulate the enabling of LSS status in support of
the Intel DSM v1.6 Function Index 10: Enable Latch System Shutdown Status.
This is only for testing of libndctl support for LSS enable. The actual
functionality requires a reboot and therefore is not simulated. The enable
value is not recorded in nfit_test since there's no DSM to actually query
the current status of the LSS enable.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Reviewed-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Adding support in nfit_test for DSM v1.6 firmware update sequence. The test
will simulate the flashing of firmware to the DIMM. A bogus version string
will be returned as the test has no idea how to parse the firmware binary.
Any bogus binary can be used to "update" as the actual binary is not copied
into the kernel.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Reviewed-by: Vishal Verma <vishal.l.verma@intel.com>
[ vishal: also move smart calls into the nd_cmd_call block ]
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Adding NFIT platform capabilities sub table in nfit_test simulated ACPI
NFIT table. Only the first NFIT table is added with the capability
sub-table.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Reviewed-by: Ross Zwisler <ross.zwisler@linux.intel.com>
Signed-off-by: Ross Zwisler <ross.zwisler@linux.intel.com>
Allow the smart_threshold values to be changed via the 'set smart
threshold command' and trigger notifications when the thresholds are
met.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
The kernel's ND_IOCTL_SMART_THRESHOLD command is based on a payload
definition that has become broken / out-of-sync with recent versions of
the NVDIMM_FAMILY_INTEL definition. Deprecate the use of the
ND_IOCTL_SMART_THRESHOLD command in favor of the ND_CMD_CALL approach
taken by NVDIMM_FAMILY_{HPE,MSFT}, where we can manage the per-vendor
variance in userspace.
In a couple years, when the new scheme is widely deployed in userspace
packages, the ND_IOCTL_SMART_THRESHOLD support can be removed. For now
we prevent new binaries from compiling against the kernel header
definitions, but kernel still compatible with old binaries. The
libndctl.h [1] header is now the authoritative interface definition for
NVDIMM SMART.
[1]: https://github.com/pmem/ndctl
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Validate command parsing in acpi_nfit_ctl for the clear error command.
This tests for a crash condition introduced by commit 4b27db7e26
"acpi, nfit: add support for the _LSI, _LSR, and _LSW label methods".
Cc: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Ensure that the in/out sizes passed in the nd_cmd_package are sane for
the fixed output size commands (i.e. inject error and clear injected
error).
Reported-by: Dariusz Dokupil <dariusz.dokupil@intel.com>
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
The injected badrange entries can only be cleared from the kernel's
accounting by writing to the affected blocks, so when such a write sends
the clear errror DSM to nfit_test, also clear the ranges from
nfit_test's badrange list. This lets an 'ARS Inject error status' DSM to
return the correct status, omitting the cleared ranges.
Cc: Dave Jiang <dave.jiang@intel.com>
Cc: Dan Williams <dan.j.williams@intel.com>
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Reviewed-by: Dave Jiang <dave.jiang@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Add nfit_test emulation for the new ACPI 6.2 error injectino DSMs.
This will allow unit tests to selectively inject the errors they wish to
test for.
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
[vishal: Move injection functions to ND_CMD_CALL]
[vishal: Add support for the notification option]
[vishal: move an nfit_test private definition into a local header]
Signed-off-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
To test ndctl list which use interface of Translate SPA,
nfit_test needs to emulates it.
This test module searches region which includes SPA and
returns 1 dimm handle which is last one.
Signed-off-by: Yasunori Goto <y-goto@jp.fujitsu.com>
Reviewed-by: Vishal Verma <vishal.l.verma@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Improve coverage of NVDIMM-N test scenarios by providing a test bus
incapable of label operations.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
mmio_flush_range() suffers from a lack of clearly-defined semantics,
and is somewhat ambiguous to port to other architectures where the
scope of the writeback implied by "flush" and ordering might matter,
but MMIO would tend to imply non-cacheable anyway. Per the rationale
in 67a3e8fe90 ("nd_blk: change aperture mapping from WC to WB"), the
only existing use is actually to invalidate clean cache lines for
ARCH_MEMREMAP_PMEM type mappings *without* writeback. Since the recent
cleanup of the pmem API, that also now happens to be the exact purpose
of arch_invalidate_pmem(), which would be a far more well-defined tool
for the job.
Rather than risk potentially inconsistent implementations of
mmio_flush_range() for the sake of one callsite, streamline things by
removing it entirely and instead move the ARCH_MEMREMAP_PMEM related
definitions up to the libnvdimm level, so they can be shared by NFIT
as well. This allows NFIT to be enabled for arm64.
Signed-off-by: Robin Murphy <robin.murphy@arm.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
The root cause of panic is the num_pm of nfit_test1 is wrong.
Though 1 is specified for num_pm at nfit_test_init(), it must be 2,
because nfit_test1->spa_set[] array has 2 elements.
Since the array is smaller than expected, the driver breaks other area.
(it is often the link list of devres).
As a result, panic occurs like the following example.
CPU: 4 PID: 2233 Comm: lt-libndctl Tainted: G O 4.12.0-rc1+ #12
RIP: 0010:__list_del_entry_valid+0x6c/0xa0
Call Trace:
release_nodes+0x76/0x260
devres_release_all+0x3c/0x50
device_release_driver_internal+0x159/0x200
device_release_driver+0x12/0x20
bus_remove_device+0xfd/0x170
device_del+0x1e8/0x330
platform_device_del+0x28/0x90
platform_device_unregister+0x12/0x30
nfit_test_exit+0x2a/0x93b [nfit_test]
Cc: <stable@vger.kernel.org>
Signed-off-by: Yasunori Goto <y-goto@jp.fujitsu.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
acpi_evaluate_dsm() and friends take a pointer to a raw buffer of 16
bytes. Instead we convert them to use guid_t type. At the same time we
convert current users.
acpi_str_to_uuid() becomes useless after the conversion and it's safe to
get rid of it.
Acked-by: Rafael J. Wysocki <rafael.j.wysocki@intel.com>
Cc: Borislav Petkov <bp@suse.de>
Acked-by: Dan Williams <dan.j.williams@intel.com>
Cc: Amir Goldstein <amir73il@gmail.com>
Reviewed-by: Jarkko Sakkinen <jarkko.sakkinen@linux.intel.com>
Reviewed-by: Jani Nikula <jani.nikula@intel.com>
Acked-by: Jani Nikula <jani.nikula@intel.com>
Cc: Ben Skeggs <bskeggs@redhat.com>
Acked-by: Benjamin Tissoires <benjamin.tissoires@redhat.com>
Acked-by: Joerg Roedel <jroedel@suse.de>
Acked-by: Adrian Hunter <adrian.hunter@intel.com>
Cc: Yisen Zhuang <yisen.zhuang@huawei.com>
Acked-by: Bjorn Helgaas <bhelgaas@google.com>
Acked-by: Felipe Balbi <felipe.balbi@linux.intel.com>
Acked-by: Mathias Nyman <mathias.nyman@linux.intel.com>
Reviewed-by: Heikki Krogerus <heikki.krogerus@linux.intel.com>
Acked-by: Mark Brown <broonie@kernel.org>
Signed-off-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com>
Signed-off-by: Christoph Hellwig <hch@lst.de>
The workqueue may still be running when the devres callbacks start
firing to deallocate an acpi_nfit_desc instance. Stop and flush the
workqueue before letting any other devres de-allocations proceed.
Reported-by: Linda Knippers <linda.knippers@hpe.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Keep the nfit_test instances alive until after nfit_test_teardown(), as
we may be doing resource lookups until the final un-registrations have
completed. This fixes crashes of the form.
BUG: unable to handle kernel NULL pointer dereference at 0000000000000038
IP: __release_resource+0x12/0x90
Call Trace:
remove_resource+0x23/0x40
__wrap_remove_resource+0x29/0x30 [nfit_test_iomap]
acpi_nfit_remove_resource+0xe/0x10 [nfit]
devm_action_release+0xf/0x20
release_nodes+0x16d/0x2b0
devres_release_all+0x3c/0x60
device_release+0x21/0x90
kobject_release+0x6a/0x170
kobject_put+0x2f/0x60
put_device+0x17/0x20
platform_device_unregister+0x20/0x30
nfit_test_exit+0x36/0x960 [nfit_test]
Reported-by: Linda Knippers <linda.knippers@hpe.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Add a simulated dimm with an ACPI_NFIT_MEM_MAP_FAILED indication, and
set the ACPI_NFIT_MEM_HEALTH_ENABLED flag on all the dimms where
nfit_test simulates health events, but spread it out over several
redundant memdev entries to test that the nfit driver coalesces all the
flags.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
For testing changes to the iset cookie algorithm we need a value that is
constant from run-to-run.
Stop including dynamic data in the emulated region_offset values. Also,
pick values that sort in a different order depending on whether the
comparison is a memcmp() of two 8-byte arrays or subtraction of two
64-bit values.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
A recent flurry of bug discoveries in the nfit driver's DSM marshalling
routine has highlighted the fact that we do not have unit test coverage
for this routine. Add a self-test of acpi_nfit_ctl() routine before
probing the "nfit_test.0" device. This mocks stimulus to acpi_nfit_ctl()
and if any of the tests fail "nfit_test.0" will be unavailable causing
the rest of the tests to not run / fail.
This unit test will also be a place to land reproductions of quirky BIOS
behavior discovered in the field and ensure the kernel does not regress
against implementations it has seen in practice.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Update nfit_test infrastructure to enable labels for the dimm on the
nfit_test.1 bus. This bus has a pmem region without aliased blk space,
so it is a candidate for dynamically enabling label support by writing
a namespace index block.
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Thomas Gleixner