tools/testing/nvdimm: Fix the array size for dimm devices.
KASAN reports following global out of bounds access while
nfit_test is being loaded. The out of bound access happens
the following reference to dimm_fail_cmd_flags[dimm]. 'dimm' is
over than the index value, NUM_DCR (==5).
static int override_return_code(int dimm, unsigned int func, int rc)
{
if ((1 << func) & dimm_fail_cmd_flags[dimm]) {
dimm_fail_cmd_flags[] definition:
static unsigned long dimm_fail_cmd_flags[NUM_DCR];
'dimm' is the return value of get_dimm(), and get_dimm() returns
the index of handle[] array. The handle[] has 7 index. Let's use
ARRAY_SIZE(handle) as the array size.
KASAN report:
==================================================================
BUG: KASAN: global-out-of-bounds in nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
Read of size 8 at addr ffffffffc10cbbe8 by task kworker/u41:0/8
...
Call Trace:
dump_stack+0xea/0x1b0
? dump_stack_print_info.cold.0+0x1b/0x1b
? kmsg_dump_rewind_nolock+0xd9/0xd9
print_address_description+0x65/0x22e
? nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
kasan_report.cold.6+0x92/0x1a6
nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
...
The buggy address belongs to the variable:
dimm_fail_cmd_flags+0x28/0xffffffffffffa440 [nfit_test]
==================================================================
Fixes: 39611e83a2
("tools/testing/nvdimm: Make DSM failure code injection...")
Signed-off-by: Masayoshi Mizuma <m.mizuma@jp.fujitsu.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
This commit is contained in:
parent
651022382c
commit
af31b04b67
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@ -140,8 +140,8 @@ static u32 handle[] = {
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[6] = NFIT_DIMM_HANDLE(1, 0, 0, 0, 1),
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};
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static unsigned long dimm_fail_cmd_flags[NUM_DCR];
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static int dimm_fail_cmd_code[NUM_DCR];
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static unsigned long dimm_fail_cmd_flags[ARRAY_SIZE(handle)];
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static int dimm_fail_cmd_code[ARRAY_SIZE(handle)];
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static const struct nd_intel_smart smart_def = {
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.flags = ND_INTEL_SMART_HEALTH_VALID
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@ -205,7 +205,7 @@ struct nfit_test {
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unsigned long deadline;
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spinlock_t lock;
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} ars_state;
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struct device *dimm_dev[NUM_DCR];
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struct device *dimm_dev[ARRAY_SIZE(handle)];
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struct nd_intel_smart *smart;
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struct nd_intel_smart_threshold *smart_threshold;
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struct badrange badrange;
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@ -2680,7 +2680,7 @@ static int nfit_test_probe(struct platform_device *pdev)
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u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
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int i;
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for (i = 0; i < NUM_DCR; i++)
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for (i = 0; i < ARRAY_SIZE(handle); i++)
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if (nfit_handle == handle[i])
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dev_set_drvdata(nfit_test->dimm_dev[i],
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nfit_mem);
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