w1_bq27000: remove unnecessary NULL test.
As recent change means that we now dereference 'dev' before testing for NULL. That means either the change was wrong, or the test isn't needed. As this function is only called from one driver (bq27x000_battery) and it always passed a non-NULL dev, it seems good to assume that the test isn't needed. So remove it. Reported-by: Dan Carpenter <dan.carpenter@oracle.com> Signed-off-by: NeilBrown <neilb@suse.de> Acked-by: Evgeniy Polyakov <zbr@ioremap.net> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
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@ -45,9 +45,6 @@ static int w1_bq27000_read(struct device *dev, unsigned int reg)
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u8 val;
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struct w1_slave *sl = container_of(dev->parent, struct w1_slave, dev);
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if (!dev)
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return 0;
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w1_write_8(sl->master, HDQ_CMD_READ | reg);
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val = w1_read_8(sl->master);
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