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mtd: update the ABI document about the ecc step size

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We add a new sys node for ecc step size. So update the ABI document about it.

Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
[Brian: edited description, modified 'ecc_strength']
Signed-off-by: Brian Norris <computersforpeace@gmail.com>

Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Huang Shijie 2013-08-16 10:10:09 +08:00 committed by David Woodhouse
parent f720e7ce51
commit ed20294033
1 changed files with 14 additions and 3 deletions
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17
Documentation/ABI/testing/sysfs-class-mtd
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@ -128,9 +128,8 @@ KernelVersion: 3.4
Contact: linux-mtd@lists.infradead.org
Description:
Maximum number of bit errors that the device is capable of
correcting within each region covering an ecc step. This will
always be a non-negative integer. Note that some devices will
have multiple ecc steps within each writesize region.
correcting within each region covering an ECC step (see
ecc_step_size). This will always be a non-negative integer.
In the case of devices lacking any ECC capability, it is 0.
@ -173,3 +172,15 @@ Description:
This is generally applicable only to NAND flash devices with ECC
capability. It is ignored on devices lacking ECC capability;
i.e., devices for which ecc_strength is zero.
What: /sys/class/mtd/mtdX/ecc_step_size
Date: May 2013
KernelVersion: 3.10
Contact: linux-mtd@lists.infradead.org
Description:
The size of a single region covered by ECC, known as the ECC
step. Devices may have several equally sized ECC steps within
each writesize region.
It will always be a non-negative integer. In the case of
devices lacking any ECC capability, it is 0.