Miquel Raynal 3847b9e016 mtd: mtd_oobtest: Handle bitflips during reads ... [ Upstream commit 12663b442e ] Reads from NAND devices usually trigger bitflips, this is an expected behavior. While bitflips are under a given threshold, the MTD core returns 0. However, when the number of corrected bitflips is above this same threshold, -EUCLEAN is returned to inform the upper layer that this block is slightly dying and soon the ECC engine will be overtaken so actions should be taken to move the data out of it. This particular condition should not be treated like an error and the test should continue. Signed-off-by: Miquel Raynal <miquel.raynal@free-electrons.com> Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com> Signed-off-by: Sasha Levin <alexander.levin@microsoft.com> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>		2018-04-12 12:32:20 +02:00
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Makefile	License cleanup: add SPDX GPL-2.0 license identifier to files with no license	2017-11-02 11:10:55 +01:00
mtd_nandecctest.c	mtd: nand: tests: fix regression introduced in mtd_nandectest	2016-03-04 16:59:20 -08:00
mtd_test.c	License cleanup: add SPDX GPL-2.0 license identifier to files with no license	2017-11-02 11:10:55 +01:00
mtd_test.h	License cleanup: add SPDX GPL-2.0 license identifier to files with no license	2017-11-02 11:10:55 +01:00
nandbiterrs.c	mtd: nand: Rename nand.h into rawnand.h	2017-08-13 10:11:49 +02:00
oobtest.c	mtd: mtd_oobtest: Handle bitflips during reads	2018-04-12 12:32:20 +02:00
pagetest.c	mtd: tests: consolidate kmalloc/memset 0 call to kzalloc	2016-01-06 15:17:42 -08:00
readtest.c	mtd: readtest: don't clobber error reports	2015-05-14 09:56:31 -07:00
speedtest.c	mtd: tests: Replace timeval with ktime_t	2015-10-26 13:23:47 -07:00
stresstest.c	mtd: Make MTD tests cancelable	2015-04-05 18:12:53 -07:00
subpagetest.c	mtd: subpagetest: fix wrong written check in function write_eraseblock2	2017-06-08 16:39:21 -07:00
torturetest.c	mtd: tests: Replace timeval with ktime_t	2015-10-26 13:23:47 -07:00