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doc: driver-model: Update dm tests run using test.py

Since all the tests are implemented in pytest infrastructure,
So update the dm tests with the same instead of ./test/dm/test-dm.sh

Cc: Tom Rini <trini@konsulko.com>
Cc: Simon Glass <sjg@chromium.org>
Acked-by: Stephen Warren <swarren@nvidia.com>
Signed-off-by: Jagan Teki <jteki@openedev.com>
utp
Jagan Teki 2016-03-17 12:23:18 +05:30 committed by Simon Glass
parent 770eb30ed9
commit e57f9c8eef
1 changed files with 126 additions and 99 deletions

View File

@ -90,110 +90,137 @@ The intent with driver model is that the core portion has 100% test coverage
in sandbox, and every uclass has its own test. As a move towards this, tests in sandbox, and every uclass has its own test. As a move towards this, tests
are provided in test/dm. To run them, try: are provided in test/dm. To run them, try:
./test/dm/test-dm.sh ./test/py/test.py --bd sandbox --build -k ut_dm -v
You should see something like this: You should see something like this:
<...U-Boot banner...> (venv)$ ./test/py/test.py --bd sandbox --build -k ut_dm -v
Running 53 driver model tests +make O=/root/u-boot/build-sandbox -s sandbox_defconfig
Test: dm_test_autobind +make O=/root/u-boot/build-sandbox -s -j8
Test: dm_test_autoprobe ============================= test session starts ==============================
Test: dm_test_bus_child_post_bind platform linux2 -- Python 2.7.5, pytest-2.9.0, py-1.4.31, pluggy-0.3.1 -- /root/u-boot/venv/bin/python
Test: dm_test_bus_child_post_bind_uclass cachedir: .cache
Test: dm_test_bus_child_pre_probe_uclass rootdir: /root/u-boot, inifile:
Test: dm_test_bus_children collected 199 items
Device 'c-test@0': seq 0 is in use by 'd-test'
Device 'c-test@1': seq 1 is in use by 'f-test'
Test: dm_test_bus_children_funcs
Test: dm_test_bus_children_iterators
Test: dm_test_bus_parent_data
Test: dm_test_bus_parent_data_uclass
Test: dm_test_bus_parent_ops
Test: dm_test_bus_parent_platdata
Test: dm_test_bus_parent_platdata_uclass
Test: dm_test_children
Test: dm_test_device_get_uclass_id
Test: dm_test_eth
Using eth@10002000 device
Using eth@10003000 device
Using eth@10004000 device
Test: dm_test_eth_alias
Using eth@10002000 device
Using eth@10004000 device
Using eth@10002000 device
Using eth@10003000 device
Test: dm_test_eth_prime
Using eth@10003000 device
Using eth@10002000 device
Test: dm_test_eth_rotate
Error: eth@10004000 address not set. test/py/tests/test_ut.py::test_ut_dm_init PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_adc_bind] PASSED
Error: eth@10004000 address not set. test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_conversion] PASSED
Using eth@10002000 device test/py/tests/test_ut.py::test_ut[ut_dm_adc_multi_channel_shot] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_adc_single_channel_conversion] PASSED
Error: eth@10004000 address not set. test/py/tests/test_ut.py::test_ut[ut_dm_adc_single_channel_shot] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_adc_supply] PASSED
Error: eth@10004000 address not set. test/py/tests/test_ut.py::test_ut[ut_dm_adc_wrong_channel_selection] PASSED
Using eth@10004000 device test/py/tests/test_ut.py::test_ut[ut_dm_autobind] PASSED
Test: dm_test_fdt test/py/tests/test_ut.py::test_ut[ut_dm_autobind_uclass_pdata_alloc] PASSED
Test: dm_test_fdt_offset test/py/tests/test_ut.py::test_ut[ut_dm_autobind_uclass_pdata_valid] PASSED
Test: dm_test_fdt_pre_reloc test/py/tests/test_ut.py::test_ut[ut_dm_autoprobe] PASSED
Test: dm_test_fdt_uclass_seq test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_post_bind] PASSED
Test: dm_test_gpio test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_post_bind_uclass] PASSED
extra-gpios: get_value: error: gpio b5 not reserved test/py/tests/test_ut.py::test_ut[ut_dm_bus_child_pre_probe_uclass] PASSED
Test: dm_test_gpio_anon test/py/tests/test_ut.py::test_ut[ut_dm_bus_children] PASSED
Test: dm_test_gpio_copy test/py/tests/test_ut.py::test_ut[ut_dm_bus_children_funcs] PASSED
Test: dm_test_gpio_leak test/py/tests/test_ut.py::test_ut[ut_dm_bus_children_iterators] PASSED
extra-gpios: get_value: error: gpio b5 not reserved test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_data] PASSED
Test: dm_test_gpio_phandles test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_data_uclass] PASSED
Test: dm_test_gpio_requestf test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_ops] PASSED
Test: dm_test_i2c_bytewise test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_platdata] PASSED
Test: dm_test_i2c_find test/py/tests/test_ut.py::test_ut[ut_dm_bus_parent_platdata_uclass] PASSED
Test: dm_test_i2c_offset test/py/tests/test_ut.py::test_ut[ut_dm_children] PASSED
Test: dm_test_i2c_offset_len test/py/tests/test_ut.py::test_ut[ut_dm_clk_base] PASSED
Test: dm_test_i2c_probe_empty test/py/tests/test_ut.py::test_ut[ut_dm_clk_periph] PASSED
Test: dm_test_i2c_read_write test/py/tests/test_ut.py::test_ut[ut_dm_device_get_uclass_id] PASSED
Test: dm_test_i2c_speed test/py/tests/test_ut.py::test_ut[ut_dm_eth] PASSED
Test: dm_test_leak test/py/tests/test_ut.py::test_ut[ut_dm_eth_act] PASSED
Test: dm_test_lifecycle test/py/tests/test_ut.py::test_ut[ut_dm_eth_alias] PASSED
Test: dm_test_net_retry test/py/tests/test_ut.py::test_ut[ut_dm_eth_prime] PASSED
Using eth@10004000 device test/py/tests/test_ut.py::test_ut[ut_dm_eth_rotate] PASSED
Using eth@10002000 device test/py/tests/test_ut.py::test_ut[ut_dm_fdt] PASSED
Using eth@10004000 device test/py/tests/test_ut.py::test_ut[ut_dm_fdt_offset] PASSED
Test: dm_test_operations test/py/tests/test_ut.py::test_ut[ut_dm_fdt_pre_reloc] PASSED
Test: dm_test_ordering test/py/tests/test_ut.py::test_ut[ut_dm_fdt_uclass_seq] PASSED
Test: dm_test_pci_base test/py/tests/test_ut.py::test_ut[ut_dm_gpio] PASSED
Test: dm_test_pci_swapcase test/py/tests/test_ut.py::test_ut[ut_dm_gpio_anon] PASSED
Test: dm_test_platdata test/py/tests/test_ut.py::test_ut[ut_dm_gpio_copy] PASSED
Test: dm_test_pre_reloc test/py/tests/test_ut.py::test_ut[ut_dm_gpio_leak] PASSED
Test: dm_test_remove test/py/tests/test_ut.py::test_ut[ut_dm_gpio_phandles] PASSED
Test: dm_test_spi_find test/py/tests/test_ut.py::test_ut[ut_dm_gpio_requestf] PASSED
Invalid chip select 0:0 (err=-19) test/py/tests/test_ut.py::test_ut[ut_dm_i2c_bytewise] PASSED
SF: Failed to get idcodes test/py/tests/test_ut.py::test_ut[ut_dm_i2c_find] PASSED
SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB test/py/tests/test_ut.py::test_ut[ut_dm_i2c_offset] PASSED
Test: dm_test_spi_flash test/py/tests/test_ut.py::test_ut[ut_dm_i2c_offset_len] PASSED
2097152 bytes written in 0 ms test/py/tests/test_ut.py::test_ut[ut_dm_i2c_probe_empty] PASSED
SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB test/py/tests/test_ut.py::test_ut[ut_dm_i2c_read_write] PASSED
SPI flash test: test/py/tests/test_ut.py::test_ut[ut_dm_i2c_speed] PASSED
0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_leak] PASSED
1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_led_base] PASSED
2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_led_gpio] PASSED
3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_led_label] PASSED
Test passed test/py/tests/test_ut.py::test_ut[ut_dm_lifecycle] PASSED
0 erase: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_mmc_base] PASSED
1 check: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_net_retry] PASSED
2 write: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_operations] PASSED
3 read: 0 ticks, 65536000 KiB/s 524288.000 Mbps test/py/tests/test_ut.py::test_ut[ut_dm_ordering] PASSED
Test: dm_test_spi_xfer test/py/tests/test_ut.py::test_ut[ut_dm_pci_base] PASSED
SF: Detected M25P16 with page size 256 Bytes, erase size 64 KiB, total 2 MiB test/py/tests/test_ut.py::test_ut[ut_dm_pci_busnum] PASSED
Test: dm_test_uclass test/py/tests/test_ut.py::test_ut[ut_dm_pci_swapcase] PASSED
Test: dm_test_uclass_before_ready test/py/tests/test_ut.py::test_ut[ut_dm_platdata] PASSED
Test: dm_test_usb_base test/py/tests/test_ut.py::test_ut[ut_dm_power_pmic_get] PASSED
Test: dm_test_usb_flash test/py/tests/test_ut.py::test_ut[ut_dm_power_pmic_io] PASSED
USB-1: scanning bus 1 for devices... 2 USB Device(s) found test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_autoset] PASSED
Failures: 0 test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_autoset_list] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_get] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_current] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_enable] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_mode] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_power_regulator_set_get_voltage] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_pre_reloc] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_ram_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_regmap_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_regmap_syscon] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_remoteproc_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_remove] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_reset_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_reset_walk] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_rtc_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_rtc_dual] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_rtc_reset] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_rtc_set_get] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_spi_find] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_spi_flash] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_spi_xfer] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_syscon_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_syscon_by_driver_data] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_timer_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_uclass] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_uclass_before_ready] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_find] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_find_by_name] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_get] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_uclass_devices_get_by_name] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_flash] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_keyb] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_multi] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_remove] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree_remove] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_usb_tree_reorder] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_base] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_bmp] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_bmp_comp] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_chars] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_context] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation1] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation2] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_rotation3] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_text] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype_bs] PASSED
test/py/tests/test_ut.py::test_ut[ut_dm_video_truetype_scroll] PASSED
======================= 84 tests deselected by '-kut_dm' =======================
================== 115 passed, 84 deselected in 3.77 seconds ===================
What is going on? What is going on?
----------------- -----------------